admin 9eb1e19651 test(firmware): event_log boot recovery — partial fill and post-wrap ...

Exercises the slot-scan logic in event_log_init(): after a simulated
reboot (RAM state cleared, NVS slots preserved) the module must
resume with the correct head/cnt so newest-first read order is
unchanged and subsequent writes continue the seq monotonically.

Adds native-only event_log_test_simulate_reboot() helper. Lifts the
slot-scan loop out of the #ifdef ARDUINO guard so the native stub
exercises the same recovery path as production; the platform-specific
NVS setup remains guarded.

2026-04-23 13:18:08 -07:00

..

event_log.cpp

test(firmware): event_log boot recovery — partial fill and post-wrap

2026-04-23 13:18:08 -07:00

event_log.h

test(firmware): event_log boot recovery — partial fill and post-wrap

2026-04-23 13:18:08 -07:00